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| 브랜드 이름: | ZMSH |
| MOQ: | 25 PC |
| 배달 시간: | 2-4 주 |
| 지불 조건: | 티/티 |
This 2-inch C-plane sapphire substrate is manufactured from high-purity single-crystal aluminum oxide (Al₂O₃) using advanced crystal growth and precision slicing techniques. Featuring a Single-Side Polished (SSP) surface, stable thickness, and low bow control, this substrate is ideal for equipment calibration, thin-film deposition trials, and non-critical semiconductor or photonics R&D.
Each wafer undergoes strict dimensional and visual inspection, and all shipments include full batch traceability.
High-Purity Sapphire (Al₂O₃): Excellent mechanical strength, thermal stability, and chemical resistance.
C-Plane (0001) Orientation: Standard orientation for GaN, optical coatings, and laser applications.
SSP Surface: Polished front side ensures uniform deposition; backside lapped for stable fixture handling.
Low Bow <10 µm: Maintains flatness for reliable processing.
Dummy Grade: Cost-effective for process experiments and equipment tuning.
Strict Quality Control: Batch No. and Lot No. provided for full traceability.
| Item | Specification |
|---|---|
| Product | 2-inch C-Plane SSP Sapphire Substrate |
| Material | Single-Crystal Al₂O₃ |
| Diameter | 50.8 mm |
| Orientation | C-plane (0001) |
| Thickness | 430 µm ± 25 µm |
| Surface Finish | SSP (Single Side Polished) |
| Bow | <10 µm |
| Grade | Dummy Grade |
| Quantity | 25 pcs |
This dummy-grade sapphire substrate is suitable for:
Deposition trials (ALD / PVD / CVD / MOCVD)
Equipment calibration and parameter tuning
Coating uniformity and process evaluation
Thin-film R&D and non-critical photonics experiments
University training and laboratory teaching
Optical testing and functional demonstration setups
Class 100 cleanroom inspection and handling
25 pcs per wafer cassette with protective separators
Vacuum-sealed, anti-static packaging to prevent contamination
Lot and batch labels included for full traceability
Visual defect screening before shipment
Dummy-grade substrates have correct mechanical dimensions but may not meet the optical, surface defect, or epi-ready standards required for GaN growth or device manufacturing. They are ideal for process testing and calibration.
For general process verification, yes.
However, for high-quality GaN or epitaxial device fabrication, we recommend switching to prime-grade or epi-ready DSP sapphire for better flatness, TTV, and surface defect control.
Yes. We support custom:
Thickness (200–1500 µm)
SSP / DSP
C-plane, A-plane, R-plane, M-plane
Laser marking, orientation flats, custom chamfering
Please contact us with your specifications.
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